Electronic Component Testers & Handlers
Systems for ageing and testing capacitors, loose or in lead frame form, stick or magazine fed, tests at temperatures of 140 degrees C, including, capacitance, leakage current and surge, selectable binning allows for flexible sorting.
Microchips, bowl fed and loaded into carriers for testing and ageing, the components are sorted into pre-selected tolerances.
Recent solutions have included the testing and packaging of high voltage transformers, zener diodes and thermistors.